Height Accuracy for the First Part of the Global TanDEM-X DEM Data

TitleHeight Accuracy for the First Part of the Global TanDEM-X DEM Data
Publication TypeBook Chapter
Year of Publication2015
AuthorsWecklich, Christopher, Carolina Gonzalez, and Benjamin Bräutigam
Secondary AuthorsJasiewicz, Jaroslaw, Zbigniew Zwoliński, Helena Mitasova, and Tomislav Hengl
Book TitleGeomorphometry for Geosciences
Pagination5 - 8
PublisherBogucki Wydawnictwo Naukowe, Adam Mickiewicz University in Poznań - Institute of Geoecology and Geoinformation
CityPoznań, Poland
ISBN Number978-83-7986-059-3

The TanDEM-X system is an innovative radar mission, which is comprised of two formation flying satellites, with the primary goal of generating a global Digital Elevation Model (DEM) of unprecedented accuracy. TanDEM-X, being a large single-pass radar interferometer, achieves this accuracy through a flexible baseline selection enabling the acquisition of highly accurate cross-track interferograms that are not impacted by temporal decorrelation or atmospheric disturbances. At least two global coverages (four in the case of difficult terrain) are combining into a homogenous global DEM mosaic consisting of 1° by 1° geocells. This paper provides a quality summary of the currently available part of the TanDEM-X global DEM with respect to the DEM absolute and relative height accuracy as well as to void density per geocell.

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